| #1922580 in Books | Cambridge University Press | 2003-05-15 | Original language:English | PDF # 1 | 9.72 x1.93 x6.85l,4.80 | File Name: 0521773563 | 1016 pages |
||7 of 11 people found the following review helpful.| Difficult to Understand|By Aaron|I starting reading this book with an open mind and thought I would like it. However, after the first chapter I began encountering unexplained notation and abbreviations that do not exist in the index. I have started finding many algorithms and concepts that leave me scratching my head - either the authors are brilliant or they've managed to pu|About the Author|Niraj Jha is Professor of Electrical Engineering at Princeton University and head of the Center of Embedded System-on-a-Chip Design, where his current research is focussed on the synthesis and testing of these devices. He is a fellow of IEEE, a
Device testing represents the single largest manufacturing expense in the semiconductor industry, costing over $40 billion a year. The most comprehensive and wide-ranging book of its kind, Testing of Digital Systems covers everything you need to know about this vitally important subject. Starting right from the basics, the authors take the reader through every key area, including detailed treatment of the latest techniques such as system-on-a-chip and IDDQ testing. Writ...
[PDF.qm27] Testing of Digital Systems Rating: 4.78 (761 Votes)
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You can specify the type of files you want, for your device.Testing of Digital Systems | N. K. Jha, S. Gupta. I really enjoyed this book and have already told so many people about it!
