[Download] A Designer’s Guide to Built-In Self-Test (Frontiers in Electronic Testing)
·•●- Charles E. Stroud ·•●-
| #3400804 in Books | Springer | 2002-05-31 | Original language:English | PDF # 1 | 9.21 x.81 x6.14l,1.52 | File Name: 1402070500 | 320 pages |
||0 of 0 people found the following review helpful.| good coverage of BIST methods|By W Boudville|Built-in Self-Test is now highly desirable in chip design. As the linewidth keeps decreasing, and the number of transistors rises, the sheer complexity necessitates BIST as a basic design principle. Hence Stroud offers you a recent and timely survey of BIST methods. The writing quality is not bad, and he gives a good coverage of the
A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.
[PDF.jo48] A Designer’s Guide to Built-In Self-Test (Frontiers in Electronic Testing) Rating: 3.79 (442 Votes)
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